Join Fernando López as he explores how modalities reveal complementary defect signatures across materials and assemblies.
In today’s challenging geoeconomic environment, manufacturers must increase throughput while reducing scrap and rework. At the same time, digital transformation is reshaping quality control, shifting from periodic spot checks to continuous, data-driven process monitoring with tighter tolerances and full traceability.
This webinar explores how terahertz and infrared inspection modalities reveal complementary defect signatures across materials and assemblies. Fernando López, Solutions Manager at INO, will present practical use cases and demonstrate how complex imaging data can be translated into clear operational outputs such as pass/fail criteria, trend monitoring, and root-cause diagnostics. The session will also highlight how advanced inspection systems strengthen digital Quality Control frameworks and enable scalable, AI-driven quality workflows.
Key Takeaways
Who Should Attend?
Manufacturing engineers, quality managers, process engineers, R&D specialists, and digital transformation leaders seeking to modernize inspection strategies and strengthen data-driven Quality Control systems.