Each optical system is somewhat limited by its individual components performance, and Terahertz (THz) systems are no exception. To support and validate the ongoing development of INO's THz systems, proper characterization is needed.
In this webinar, Alex Paquet, Research Scientist for Imaging Systems at INO, will present the definitions and physics of imaging resolution as well as targets used for resolution tests such as bar charts, siemens star, slanted edge and point source. Alex will also discuss the effect of different optical system parameters and illumination such as the effect of source coherence on images.
Alex Paquet, Research Scientist for Imaging Systems, INO
Pierre Talbot, Business Development Manager, INO